Erratum to“Accurate determination of film thickness by low-angle x-ray reflection”

Ming Xu(徐明) Tao Yang(楊濤) Wenxue Yu(于文學) Ning Yang(楊寧)Cuixiu Liu(劉翠秀) Zhenhong Mai(麥振洪) Wuyan Lai(賴武彥) and Kun Tao(陶琨)

1Institute of Physics&Center for Condensed Matter Physics,Chinese Academy of Sciences,Beijing 100080,China

2Department of Materials Science,Jilin University,Changchun 130023,China

3Department of Materials Science,Tsinghua University,Beijing 100083,China

Keywords: erratum,film thickness,x-ray

In II.optical theory of film,[1]Eq.(6)should be

All subsequent derivations were given based on the correct Eq.(6),so the conclusions in the paper[1]are not affected by the errata.